FEIS 2013

December 9 — 12, 2013, Key West, Florida

FEIS 2013 - Femtosecond Electron Imaging and Spectroscopy


We are witnessing tremendous opportunities in ultrafast sciences with the development of extremely bright radiation sources to investigate the structure and spectroscopy of matter with atomistic space and femtosecond time resolution. Whereas a strong focus has been on X-ray sources, notably free electron laser (FEL) sources, the use of femtosecond electron pulses has also shown enormous promise in the last decade, especially in the investigation of ultra-small sample regime facilitated by the high sensitivity of electron scattering and the relative ease in designing electron optics for imaging and diffraction of nanomaterials. Moreover, important innovations have been achieved by incorporating ultrafast photoemission sources into various electron microscope setups. Most recently, a new trend of integrating the FEL high-brightness electron beam concept into the ultrafast electron diffraction and microscope system design is likely to open up new prospects and applications of femtosecond diffraction, imaging and spectroscopy with high throughput.

FEIS 2013 will bring together leaders engaged in cutting edge development of high-brightness electron and X-ray beam systems and their applications to frontier science problems, in order to showcase recent progress and discuss future directions and opportunities. It will also attempt to draw comparisons to other recently emerging approaches to ultrafast observation. The workshop will build on the potential synergy between related technology developments and various emerging scientific opportunities.

Deadlines and Dates

Registration Deadline: November 15, 2013
Abstract Submission Deadline: November 15, 2013
Meeting: December 9th - 12th, 2013
Hotel Reservation Deadline: November 9, 2013 for Casa Marina Resort (other nearby hotels exist)
Paper Submission Deadline: March 15th, 2014

Workshop Themes include

  • Synergy in the developments of ultrafast X-ray and electron characterization techniques
  • Understanding and mitigating high intensity beam effects on materials
  • Fundamental challenges in designing high-throughput microscopes (source, optical system, and detection)
  • Novel molecular and material processes unveiled by ultrafast electron microscopy, diffraction, and spectroscopy
  • In-situ microscopy and spectroscopy


Glass bottom boat tour to tropical reef

Scientific Committee

  • Thomas Devereaux (Stanford/SLAC)
  • Valery Dolgashev (SLAC)
  • Jim Freericks (Georgetown)
  • Peter Hawkes (Toulouse)
  • Margaret Murnane (Colorado/JILA)
  • Jerry Nolen (ANL)
  • Hrvoje Petek (Pittsburgh)
  • Harald Rose (Ulm)
  • Stephen Rosenkranz (Argonne)
  • Rob Ryne (LBNL)
  • John Spence (Arizona State)
  • Weishi Wan (LBNL)
  • Linda Young (Argonne)
  • Yimei Zhu (BNL)

Organizing Committee

Matter Physics
Electron Diffraction
and Microscopy
Chong-Yu Ruan Phillip Duxbury Martin Berz Marty Crimp
Kyoko Makino