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Proceedings, Femtosecond Electron Imaging and Spectroscopy 2013, Key West, Florida

Abstract

This volume comprises proceedings of the conference on Femtosecond Electron Imaging and Spectroscopy (FEIS 2013), which was held on December 9-12, 2013 in Key West, Florida, USA. The conference built on the potential synergy between related technology developments and various emerging scientific opportunities and brought together leaders engaged in cutting edge development of high brightness electron and X-ray beam systems and their applications to frontier science problems. FEIS 2013, the first in this series, was organized with the goal of initiating conversation between different communities with the objective of reviewing the current state-of-the-art development and open issues of ultrafast electron imaging technologies, and to assess emerging scientific opportunities enabled by ultrafast imaging and spectroscopy. Furthermore, a goal was to identify the key technical challenges in the design and applications of ultrafast electron imaging systems, and to forge cross-fertilization between the electron microscopy, accelerator and beam physics, and ultrafast communities, and to have experimentalists and theorists address common challenges and promote synergistic developments.

M. Berz, P. Duxbury, K. Makino, C.-Y. Ruan (Eds.), Advances in Imaging and Electron Physics 191, Elsevier, 2015

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